F-Scan: A DFT Method for Functional Scan at RTL
نویسندگان
چکیده
منابع مشابه
F-Scan: A DFT Method for Functional Scan at RTL
Due to the difficulty of test pattern generation for sequential circuits, several design-for-testability (DFT) approaches have been proposed. An improvement to these current approaches is needed to cater to the requirements of today’s more complicated chips. This paper introduces a new DFT method applicable to high-level description of circuits, which optimally utilizes existing functional elem...
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ژورنال
عنوان ژورنال: IEICE Transactions on Information and Systems
سال: 2011
ISSN: 0916-8532,1745-1361
DOI: 10.1587/transinf.e94.d.104